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      首頁技術支持 Cardinal門控振蕩器的表征

      Cardinal門控振蕩器的表征

      來源:http://yijindz.com 作者:億金電子 2024年03月02
      Cardinal門控振蕩器的表征,門控振蕩器的穩定性和包絡形狀的測量
      門控或鍵控振蕩器快速打開和關閉。 這種類型的操作通常導致頻率變化或 “唧唧喳喳”。對于帶有抖動和定時分析包的勒克羅伊示波器來說,表征門控石英晶振的鍵控特性和頻率穩定性是一項簡單的工作。
      圖1顯示了一個典型的在315MHz上測量,無鑰匙進入系統發射機。這種設備使用鍵控連續波發送數字信號的發射器給接收者的信息位于車輛中。數據是通過控制爆發的寬度。
      設計者感興趣的是門控脈沖的形狀包絡和頻率石英晶體振蕩器的變化鍵控。的形狀包絡影響雜散信號的內容。同樣的, 頻率或相位調制造成的承運人的門控振蕩器會影響信號純度。這些中的任何一個 影響可能導致帶外信號分量和未能滿足的可能性 排放認證要求。
      在圖1中,前緣傳輸的波形是 在通道2中捕獲,顯示為頂部軌跡。跟蹤A包含 極值數學函數稱為roof,它提取每個周期的峰值傳輸信號。這個痕跡是 用于評估的上升時間爆裂。上升時間參數出現在第一個 參數讀數的行 位于正下方 顯示的痕跡。
      跡線B,從上面數第三個, 包含抖動軌跡 頻率和的函數 顯示了中的變化頻率是時間的函數。 請注意頻率 收斂到標稱值315大約250納秒。這底部軌跡包含周期到周期的抖動跟蹤 周期變化。這兩個功能允許用戶 指定振幅閾值 和滯后水平。貼片晶振這允許用戶啟動 測量僅在 信號已經達到合理水平。閾值水平 顯示為水平虛線 來源行 波形(CH2)。請注意 抖動跟蹤功能不啟動直到閾值水平被已實現。這避免了錯誤 由讀取噪音引起 波形的開始。



      Cardinal門控振蕩器的表征

      Cardinal Components Inc Characterizing Gated Oscillators

      Measuring Stability And Envelope Shape In Gated Oscillators

      Gated or keyed oscillators are turned on and off rapidly. This type of operation often causes frequency changes or “chirps”. Characterizing the keying characteristics and frequency stability of gated oscillators is an easy job for LeCroy oscilloscopes with the jitter and timing analysis package.

      Figure 1 shows a typical measurement on a 315 MHz keyless entry system transmitter. This type of device uses a keyed continuous wave (cw) transmitter to send digital information to the receiver located in a vehicle. Data is encoded by controlling the width of the burst.

      Of interest to the designer is the shape of the gated burst envelope and the frequency variation as the oscillator is keyed. The shape of the envelope affects the spurious content of the signal. Likewise, frequency or phase modulation of the carrier caused by the gating the oscillator affects signal purity. Either of these effects can result in out of band signal components and a potential for failure to meet emissions certification requirements.

      In figure 1 the leading edge of the transmitted waveform is captured in channel 2 shown as the top trace. Trace A contains the extrema math function called roof, which extracts the peak values of each cycle of the transmitted signal. This trace is used to evaluate the risetime of the burst. The risetime parameter appears on the first line of the parameter readout located directly below the displayed traces.

      Trace B, third from the top, contains the JitterTrack function of frequency and shows the variation in frequency as a function of time. Note that the frequency converges to the nominal 315 MHz in about 250 ns. The bottom trace contains the JitterTrack of cycle to cycle period variation. Both of these functions allow the user to specify the amplitude threshold and hysteresis level. This allows the user to start the measurement only after the signal has achieved a reasonable level. The threshold level appears as a dotted horizontal line of the source waveform(CH2). Note that the JitterTrack function do not start until the threshold level is achieved. This avoids errors caused by reading noise at the beginning of the waveform. 
       

      原廠編碼 進口晶振 系列 Description描述
      CJAE7L-A7BR-75.49472TS Cardinal晶振 CJAE OSCILLATOR 75.49472MHZ 3.3V SMD
      CPPT4T-A7BP-00.8000TS Cardinal晶振 CPP PROG OSC 5V .8MHZ
      CFE4-A7BP-155.52 Cardinal晶振 CFE4 OSC XO 155.52MHZ LVPECL SMD
      CFE4-A7BP-156.25 Cardinal晶振 CFE4 OSC XO 156.25MHZ LVPECL SMD
      CFE4-A7BP-212.5 Cardinal晶振 CFE4 OSC XO 212.50MHZ LVPECL SMD
      CFE4-A7BP-311.04 Cardinal晶振 CFE4 OSC XO 311.04MHZ LVPECL SMD
      CFE4-A7BP-622.08 Cardinal晶振 CFE4 OSC XO 622.08MHZ LVPECL SMD
      CFL4-A7BP-155.52 Cardinal晶振 CFL4 OSC XO 155.52MHZ LVDS SMD
      CFL4-A7BP-156.25 Cardinal晶振 CFL4 OSC XO 156.25MHZ LVDS SMD
      CFL4-A7BP-212.5 Cardinal晶振 CFL4 OSC XO 212.50MHZ LVDS SMD
      CFL4-A7BP-311.04 Cardinal晶振 CFL4 OSC XO 311.04MHZ LVDS SMD
      CFL4-A7BP-622.08 Cardinal晶振 CFL4 OSC XO 622.08MHZ LVDS SMD
      CFED-A7BP-155.52TS Cardinal晶振 CFED OSC XO 155.52MHZ LVPECL SMD
      CFED-A7BP-156.25TS Cardinal晶振 CFED OSC XO 156.25MHZ LVPECL SMD
      CFED-A7BP-212.5TS Cardinal晶振 CFED OSC XO 212.50MHZ LVPECL SMD
      CFED-A7BP-311.04TS Cardinal晶振 CFED OSC XO 311.04MHZ LVPECL SMD
      CFED-A7BP-622.08TS Cardinal晶振 CFED OSC XO 622.08MHZ LVPECL SMD
      CFL-A7BP-155.52TS Cardinal晶振 CFL OSC XO 155.52MHZ LVDS SMD
      CFL-A7BP-156.25TS Cardinal晶振 CFL OSC XO 156.25MHZ LVDS SMD
      CFL-A7BP-212.5TS Cardinal晶振 CFL OSC XO 212.50MHZ LVDS SMD
      CFL-A7BP-311.04TS Cardinal晶振 CFL OSC XO 311.04MHZ LVDS SMD
      CFL-A7BP-622.08TS Cardinal晶振 CFL OSC XO 622.08MHZ LVDS SMD
      CFVE-A7BP-155.52TS Cardinal晶振 CFVE OSC VCXO 155.52MHZ LVPECL SMD
      CFVE-A7BP-156.25TS Cardinal晶振 CFVE OSC VCXO 156.25MHZ LVPECL SMD
      CFVE-A7BP-212.5TS Cardinal晶振 CFVE OSC VCXO 212.50MHZ LVPECL SMD
      CFVE-A7BP-311.04TS Cardinal晶振 CFVE OSC VCXO 311.04MHZ LVPECL SMD
      CFVE-A7BP-622.08TS Cardinal晶振 CFVE OSC VCXO 622.08MHZ LVPECL SMD
      CFVED-A7BP-155.52TS Cardinal晶振 CFVED OSC VCXO 155.52MHZ LVPECL SMD
      CFVED-A7BP-156.25TS Cardinal晶振 CFVED OSC VCXO 156.25MHZ LVPECL SMD
      CFVED-A7BP-212.5TS Cardinal晶振 CFVED OSC VCXO 212.50MHZ LVPECL SMD

       


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